Scientific Committee:

  • Eugeniusz Ratajczyk, Warsaw University of Technology (Poland) – honorary chairman
  • Jerzy Sładek, Cracow University of Technology (Poland) – chairman
  • Albert Weckenmann, University Erlangen-Nürnberg (Germany) – vice-chairman
  • Stanisław Adamczak, Kielce University of Technology (Poland)
  • Liam Blunt, University Huddersfield (United Kingdom)
  • Marius Bulgaru, Technical University Cluj Napoca (Romania)
  • Jan Chajda, Higher Vocational State School, Kalisz (Poland)
  • Ralf Christoph, Werth Messtechnik GmbH (Germany)
  • Dariusz Czułek, Central Office of Measures, Warsaw (Poland)
  • Siniša Delčev, University of Novi Sad (Serbia)
  • Numan M. Durakbasa, Technical University Wien (Austria)
  • Ryoshu Furutani, Tokyo Denki University (Japan)
  • Józef Gawlik, Cracow University of Technology (Poland)
  • Sebastian Glazer, Carl Zeiss Sp. z o.o. (Poland)
  • Tino Hausotte, University Erlangen-Nuremberg (Germany)
  • Zbigniew Humienny, Warsaw University of Technology (Poland)
  • Otto Jusko, National Bureau of Standard, Braunschweig (Germany)
  • Andrzej Kawalec, Rzeszów University of Technology (Poland)
  • Małgorzata Kujawińska, Warsaw University of Technology (Poland)
  • Czesław Łukianowicz, Koszalin University of Technology (Poland)
  • Michael Marxer, NTB – Interstate University of Applied Sciences, Buchs (Switzerland)
  • Thomas Mathia, Ecole Centrale de Lyon (France)
  • René Mayer, École Polytechnique Montréal (Canada)
  • Calin Neamtu, Technical University Cluj Napoca (Romania)
  • Marek Nocuń
  • Paweł Pawlus, Rzeszów University of Technology (Poland)
  • Alejandro Pereira, University of Vigo (Spain)
  • Małgorzata Poniatowska, Białystok University of Technology (Poland)
  • Daniela Popescu, Technical University Cluj Napoca (Romania)
  • Walter E. Rumpf, University of Applied Sciences Frankfurt am Main (Germany)
  • Enrico Savio, University of Padua (Italy)
  • Heinrich Schwenke, ETALON AG, Braunschweig (Germany)
  • Robert Sitnik, Warsaw University of Technology (Poland)
  • Jan Szadkowski, University of Bielsko-Biala (Poland)
  • Reiner Tutsch, Technical University Braunschweig (Germany)
  • Michał Wieczorowski, Poznań University of Technology (Poland)
  • Robert G. Wilhelm, The University of North Carolina at Charlotte (USA)
  • Adam Woźniak, Warsaw University of Technology (Poland)
  • Anna Zawada-Tomkiewicz, Koszalin University of Technology (Poland)
  • Vít Zelený, Czech Metrology Institute, Prague (Czech Republic)
  • Maria Zybura-Skrabalak, Institute of Advanced Manufacturing Technology, Cracow (Poland)
  • Sabina Żebrowska-Łucyk, Warsaw University of Technology (Poland)