XII International Scientific Conference CMT

XII INTERNATIONAL SCIENTIFIC CONFERENCE
Coordinate Measuring Technique

The aim of the conference was the exchange of information on science and technological progress in the field of designing, software, practice and verification of coordinate measuring machines and also the interaction between coordinate measuring technique and geometrical product specifications.

• Coordinate measuring machines (CMM)
• Theory of coordinate measuring technique
• Traceability and CMM inspection
• Coordinate measurement in practice
• Education in coordinate metrology
• Form, orientation, location and run-out measurements
• Gears measurements
• Geometrical product specification (GPS)
• Unconventional 3D measurements
• Machine tools measuring systems and monitoring
• Surface roughness measurements
• Nanometrology

• Eugeniusz Ratajczyk, Warsaw University of Technology (Poland) – honorary chairman
• Jerzy Sładek, Cracow University of Technology (Poland) – chairman
• Albert Weckenmann, University Erlangen-Nürnberg (Germany) – Vice-chairman
• Jan Szadkowski, University of Bielsko-Biala (Poland) – Vice-chairman
• Jan Malinowski, University of Bielsko-Biala (Poland)
• Stanisław Adamczak, Kielce University of Technology (Poland)
• Ali Afjehi-Sadat, Technical University Wien (Austria)
• Liam Blunt, University Huddersfield (United Kingdom)
• Marius Bulgaru, Technical University Cluj Napoca (Romania)
• Jan Chajda, Higher Vocational State School, Kalisz (Poland)
• Leonardo De Chiffre, Technical University Denmark (Denmark)
• Siniša Delčev, University of Belgrade (Serbia)
• Gustavo D. Donatelli, Universidade Federal De Santa Catarina (Brasil)
• Numan M. Durakbasa, Technical University Wien (Austria)
• Ryoshu Furutani, Tokyo Denki University (Japan)
• Józef Gawlik, Cracow University of Technology (Poland)
• Tino Hausotte, University Erlangen-Nuremberg (Germany)
• Frank Härtig, National Bureau of Standard, Braunschweig (Germany)
• Zbigniew Humienny, Warsaw University of Technology (Poland)
• Orest Ivakhiv, National University Lviv Politechnic (Ukraine)
• Otto Jusko, National Bureau of Standard, Braunschweig (Germany)
• Andrzej Kawalec, Rzeszów University of Technology (Poland)
• Małgorzata Kujawińska, Warsaw University of Technology (Poland)
• Czesław Łukianowicz, Koszalin University of Technology (Poland)
• Michael Marxer, NTB – Interstate University of Applied Sciences, Buchs (Switzerland)
• Thomas Mathia, Ecole Centrale de Lyon (France)
• René Mayer, École Polytechnique Montréal (Canada)
• Michael McCarthy, National Physical Laboratory Teddington (United Kingdom)
• Calin Neamtu, Technical University Cluj Napoca (Romania)
• Herbert P. Osanna, Technical University Wien (Austria)
• Paweł Pawlus, Rzeszów University of Technology (Poland)
• Alejandro Pereira, University of Vigo (Spain)
• Małgorzata Poniatowska, Białystok University of Technology (Poland)
• Daniela Popescu, Technical University Cluj Napoca (Romania)
• Balakrishnan Ramamoorthy, Indian Institute of Technology Madras (India)
• Zbigniew Ramotowski, Central Office of Measures, Warsaw (Poland)
• Walter E. Rumpf, University of Applied Sciences Frankfurt am Main (Germany)
• Enrico Savio, University of Padua (Italy)
• Heinrich Schwenke, ETALON AG, Braunschweig (Germany)
• Robert Sitnik, Warsaw University of Technology (Poland)
• Krzysztof Tubielewicz, Częstochowa University of Technology (Poland)
• Reiner Tutsch, Technical University Braunschweig (Germany)
• Hendrie Viktor, Carl Zeiss Sp. z o.o. (Poland)
• Klaus Wendt, National Bureau of Standard, Braunschweig (Germany)
• Michał Wieczorowski, Poznań University of Technology (Poland)
• Robert G. Wilhelm, The University of North Carolina at Charlotte (USA)
• Adam Woźniak, Warsaw University of Technology (Poland)
• Anna Zawada-Tomkiewicz, Koszalin University of Technology (Poland)
• Vít Zelený, Czech Metrology Institute, Prague (Czech Republic)
• Maria Zybura-Skrabalak, Institute of Advanced Manufacturing Technology, Cracow (Poland)
• Sabina Żebrowska-Łucyk, Warsaw University of Technology (Poland)