Dawid Kucharski received his MS engineering degrees in physics in 2008 and his PhD in metrology in 2015 from the Poznan University of Technology. He is working as an assistant professor at the Division of Metrology and Measurement Systems, Poznan University of Technology. He specializes in optical metrology for surface texture and form measurements. He currently works on high-precision measurement systems development using laser technology and the application of artificial intelligence in surface metrology. In the past, he was also busy with trapped ions for quantum computation.
Poster title: Deep learning application for decision-making support in surface metrology